HARE: Fast Read Disturbance Threshold Profiling in Modern DRAM Chips via Reduced Timing Constraints

arXiv:2611.15469v1 Announce Type: new Abstract: Modern DRAM chips are vulnerable to read disturbance, which manifests as bitflips in a victim row physically near an aggressor row that is repeatedly activated. State-of-the-art mitigations rely on accurate and exhaustive profiling of the read disturbance threshold (RDT), i.e., the minimum number of aggressor row activations needed to induce the first bitflip. However, RDT changes significantly and unpredictably over time, motivating online profilers that dynamically adjust a mitigation's RDT configuration.